[文献] Czochralski silicon characterization by using thermoelectric

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发表于 2010-12-15 18:51:24 | 显示全部楼层 |阅读模式

Czochralski silicon characterization by using thermoelectric
power measurements at high pressure
V.V. Shchennikova,
*, S.V. Gudinaa
, A. Misiukb
, S.N. Shamina
a
Institute of Metal Physics, Ural Division of RAS, GSP-170, S.Kovalevskoi str., 18, Ekaterinburg 620219, Russia
b
Institute of Electron Technology, Al. Lotnikow 32/46, Warsaw PL-02-668, Poland

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