Correspondence among PL measurement, MBIC
measurement and defect delineation in
polycrystalline cast-Si solar cells
Ryuichi Shimokawa a'*, Michio Tajima b, Masatoshi Warashina b,
Yusaku Kashiwagi ~'a, Hitoshi Kawanami a
aElectrotechnical Laboratory, 1-1-4 Umezono, Tsukuba-shi, Ibaraki 305, Japan
b Institute of Space and Astronautical Science, Sagamihara 229, Japan
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发表于 2010-12-11 17:24:33
